ELECTRONIC APPARATUS AND CONTROLLING METHOD THEREOF

    公开(公告)号:US20200382839A1

    公开(公告)日:2020-12-03

    申请号:US16887641

    申请日:2020-05-29

    Abstract: An electronic apparatus is provided. The electronic apparatus includes: a memory configured to store volume histories for a plurality of content sources; and a processor configured to, based on a content source for providing a content being changed from a first content source to a second content source, among the plurality of content sources, identify a volume level corresponding to the second content source based on a volume history of the first content source and a volume history of the second content source among the stored volume histories, and change a currently-set volume level to the identified volume level, and update the volume history of the second content source based on the changed volume level.

    METHOD AND APPARATUS WITH DATA LOADING
    2.
    发明公开

    公开(公告)号:US20240231944A1

    公开(公告)日:2024-07-11

    申请号:US18351737

    申请日:2023-07-13

    CPC classification number: G06F9/5055 G06F16/1724

    Abstract: A processor-implemented method with data loading includes: based on sizes of a plurality of data files in a training dataset, dividing the training dataset into a plurality of sub-sets; loading some data files in each sub-set into a plurality of processors; determining a packing combination of one or more data files loaded to processors in a same group among the plurality of processors, based on a ratio of a number of data files between the plurality of sub-sets and a batch size of distributed training; determining packed data files by packing the one or more data files according to the packing combination; and reallocating the packed data files to the processors in the same group.

    NON-TRANSITORY COMPUTER-READABLE MEDIUM AND METHOD FOR MONITORING A SEMICONDUCTOR FABRICATION PROCESS

    公开(公告)号:US20200090304A1

    公开(公告)日:2020-03-19

    申请号:US16402375

    申请日:2019-05-03

    Abstract: A non-transitory computer-readable medium for monitoring a semiconductor fabrication process includes an image conversion model having an artificial neural network. The image conversion model, when executed, causes the processor to receive a first image and a second image of a semiconductor wafer. The artificial neural network is trained by inputting a dataset representing the first image and the second image, generating a conversion image of the semiconductor wafer and calibrating weights and biases of the artificial neural network to match the conversion image to the second image. A third image of the semiconductor wafer is generated based on the calibrated weights and biases of the artificial neural network. The image conversion model with the trained artificial neural network may be transmitted to another device for image conversion of low resolution images.

    METHOD AND APPARATUS WITH DATA LOADING

    公开(公告)号:US20230140239A1

    公开(公告)日:2023-05-04

    申请号:US17868361

    申请日:2022-07-19

    Abstract: A processor-implemented method with data loading includes: dividing a training data set into a plurality of subsets based on sizes of a plurality of data files included in the training data set; loading, from each of the plurality of subsets, a portion of data files in the subset to a plurality of processors based on a proportion of a number of data files of the plurality of subsets in the subset and a batch size of distributed training; and reallocating, based on sizes of data files loaded to processors in a same group among the plurality of processors, the loaded data files to the processors in the same group.

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