公开(公告)号：US11545627B2

公开(公告)日：2023-01-03

申请号：US16559332

申请日：2019-09-03

Applicant: Samsung Display Co., Ltd.

Inventor： Daeyoun Cho ,  Jongwoo Park ,  Youngtae Choi ,  Jiho Moon ,  Ju hee Lee ,  Younjae Jung

IPC: G01R31/26 ,  H01L51/00 ,  H01L27/32

Abstract: A test device includes: a plurality of signal test pads electrically connected to pads of an input sensing unit; a power test pad electrically connected to a power pattern of a display unit; a test circuit configured to apply a test signal to the signal test pads; a voltage generator configured to generate a sensing power voltage; and a ripple controller configured to change a voltage level of the sensing power voltage to apply the sensing power voltage to the power test pad.