PLASMA MONITORING SYSTEM
    1.
    发明公开

    公开(公告)号:US20240290590A1

    公开(公告)日:2024-08-29

    申请号:US18520360

    申请日:2023-11-27

    CPC classification number: H01J37/32972 H01J37/023 H01J37/226

    Abstract: A plasma monitoring system includes a gate valve disposed on a first side of a chamber, where the gate valve is opened or closed in conjunction with a plasma monitoring operation, a viewport structure disposed outside the chamber and including a plurality of light transmitting parts, and an optical emission spectroscopy disposed outside the chamber, where the optical emission spectroscopy monitors plasma by receiving plasma light transmitted through at least one of the plurality of light transmitting parts of the viewport structure.

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