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公开(公告)号:US20210345711A1
公开(公告)日:2021-11-11
申请号:US17306186
申请日:2021-05-03
Inventor: William C. O'ROURKE , Robrecht Moerkerke , Christy De Meyer , Sharvanti Pinglay
Abstract: The present disclosure relates to an antiviral thin film layer that may include a metallic material. The antiviral thin film layer may have a VLT of at least about 60%. The antiviral thin film layer may further have an influenza A subtype H1N1 antiviral rating (H1N1 antiviral rating) of not greater than about 360 minutes, where the H1N1 antiviral rating is defined as the amount of time required for H1N1 viral activity on a surface of the metallic layer to drop from an initial test concentration placed on the surface of the thin film layer to less than 25.0% of the initial concentration placed on the surface as measured using ISO21702.