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公开(公告)号:US20250012559A1
公开(公告)日:2025-01-09
申请号:US18894097
申请日:2024-09-24
Inventor: Masaharu FUKAKUSA , Takahiro NIBU , Mayu TABA
Abstract: A distance measuring device includes: a first imager and a second imager provided so as to be aligned such that fields of view thereof overlap each other; a projector configured to project pattern light in which a plurality of types of light regions having wavelength bands different from each other are distributed in a predetermined pattern, onto a range where the fields of view overlap; and a measurer configured to measure a distance to an object surface onto which the pattern light is projected, by performing a stereo correspondence point searching process on images respectively acquired by the first imager and the second imager.
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公开(公告)号:US20240378740A1
公开(公告)日:2024-11-14
申请号:US18779473
申请日:2024-07-22
Inventor: Mayu TABA , Masaharu FUKAKUSA
IPC: G06T7/593 , G06T7/521 , G06T7/80 , H04N13/00 , H04N13/239 , H04N13/246 , H04N13/254 , H04N13/296
Abstract: A distance measuring device includes: a first imaging part and a second imaging part placed such that fields of view thereof overlap each other; a projector configured to project pattern light to a range where the fields of view overlap; a measurement part configured to measure a distance to an object surface onto which the pattern light is projected, by a stereo correspondence point search process for images from the respective imaging parts; and a controller. The projector includes an imaging adjustment part configured to change an imaging position of the pattern light in an optical axis direction of a projection lens. The controller controls the imaging adjustment part such that a density of the pattern on imaging surfaces of the respective imaging parts is included in a target range.
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