公开(公告)号：US20160112148A1

公开(公告)日：2016-04-21

申请号：US14953673

申请日：2015-11-30

Applicant: MediaTek Inc.

Inventor： Jen-Yang LIU ,  I-Cheng TSAI ,  Hsueh-Wei CHIU ,  Yuan-Hwui CHUNG ,  Chun-Hsien PENG

IPC: H04B17/29 ,  H04B17/00

CPC classification number: H04B17/29 ,  H04B17/0085

Abstract: A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.

Abstract translation: 测试/校准系统包括被测设备（DUT）和校准设备。 校准的设备耦合到DUT，响应于用于测试，测量或校准DUT的内部部件的功能或性能的测试项目的控制信号，向DUT发送或接收来自DUT的测试信号。