Apparatus for measuring film thickness
    1.
    发明授权
    Apparatus for measuring film thickness 失效
    测量薄膜厚度的装置

    公开(公告)号:US3601492A

    公开(公告)日:1971-08-24

    申请号:US3601492D

    申请日:1967-11-20

    Applicant: MONSANTO CO

    CPC classification number: G01J3/28 G01B11/0675 G01J3/06

    Abstract: Improved means and method for measuring film thickness by rapidly forming and portraying optical interference fringe spectra and interpreting the same directly in terms of film thickness. An internal computer senses movement of a wavelength reference member and causes programmed indices to be displayed along with the interference fringe waveform. A single manual control, with the aid of an improved scanning and display method which balances out time lags, allows the indices to be coordinated with the fringe waveform. An automatic thickness readout device cooperates with the manual control.

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