公开(公告)号：US11490603B2

公开(公告)日：2022-11-08

申请号：US16050006

申请日：2018-07-31

Applicant: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY ,  YONSEI UNIVERSITY, UNIVERSITY—INDUSTRY FOUNDATION (UIF)

Inventor： Seok Gu Kang ,  Jeong Ho Lee ,  Joo Ho Lee ,  Jeong Eun Lee

IPC: A01K67/027 ,  A61K49/00

Abstract: The present invention relates to a brain tumor animal model that directly reflects the phenomenon in a human patient and a method of preparing the same, and more specifically, a brain tumor animal model that mutations are introduced into p53, Pten, and EGFR genes, a screening method of a therapeutic agent for a brain tumor using the animal model, and a preparing method thereof.

公开(公告)号：US20180087894A1

公开(公告)日：2018-03-29

申请号：US15427821

申请日：2017-02-08

Applicant: Korea Advanced Institute of Science and Technology

Inventor： MinHyuk Kim ,  Giljoo Nam ,  Joo Ho Lee

IPC: G01B9/04 ,  G02B21/26 ,  G02B21/06 ,  G01N21/55

CPC classification number: G01N21/55 ,  G01B11/24 ,  G02B21/06 ,  G02B21/26

Abstract: Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.

公开(公告)号：US10281396B2

公开(公告)日：2019-05-07

申请号：US15427821

申请日：2017-02-08

Applicant: Korea Advanced Institute of Science and Technology

Inventor： MinHyuk Kim ,  Giljoo Nam ,  Joo Ho Lee

IPC: G01N21/55 ,  G02B21/26 ,  G02B21/06 ,  G01B11/24

Abstract: Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.