POLISHING SLURRY COMPOSITION
    1.
    发明申请

    公开(公告)号:US20220064489A1

    公开(公告)日:2022-03-03

    申请号:US17415705

    申请日:2019-07-03

    Abstract: The present invention relates to a polishing slurry composition. A polishing slurry composition according to an embodiment of the present disclosure comprises a polishing solution containing polishing particles; and an additive solution containing a non-ionic polymer and a polishing selectivity controller. The polishing slurry composition of the present disclosure has a high polishing rate for silicon oxide films and polysilicon films, leaves no residues after shallow trench isolation (STI) polishing of semiconductor devices, and can reduce the amount of silicon oxide film dishing and decrease scratches.

    POLISHING SLURRY COMPOSITION AND METHOD FOR PRODUCING SAME

    公开(公告)号:US20210380842A1

    公开(公告)日:2021-12-09

    申请号:US17293236

    申请日:2019-05-29

    Abstract: The present disclosure relates to a polishing slurry composition and a method of producing the same. The polishing slurry composition according to one embodiment of the present disclosure includes: abrasive particles dispersed so as to have positively-charged particle surfaces; a first dispersant including a nonionic linear polymer; and a second dispersant including an anionic coiling polymer, wherein the polishing slurry composition satisfies the following Expressions 1 and 2: [Expression 1] 4≤log(milling energy)

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