公开(公告)号：US07342664B1

公开(公告)日：2008-03-11

申请号：US11124422

申请日：2005-05-06

Applicant: Juliusz George Radziszewski

Inventor： Juliusz George Radziszewski

IPC: G01B9/02

CPC classification number: G01J3/06 ,  G01J3/02 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/4535

Abstract: Scanning interferometer and method of using same providing for rapid, reliable detection of chemical compounds that are readily implemented in low-cost, portable configurations for application in a variety of monitoring and detection applications. A scanning double-beam interferometer, particularly a Michelson interferometer, in which the length of at least one of the optical paths (or arms) of the interferometer is selectively adjustable by use of an actuator in which rotational displacement of a rotatable element is converted into linear displacement of at least one reflective surface which forms an end of an optical path of the interferometer is employed to obtain interferograms of electromagnetic radiation attenuated, emitted, scattered or reflected from a sample. The length of the optical path that is adjusted is determined using an optical detection scheme, particularly where marking on the rotatable element are detected to determine linear displacement of the reflective surface.

Abstract translation: 扫描干涉仪及其使用方法可以快速，可靠地检测易于实现的低成本，便携式配置的化合物，用于各种监测和检测应用。 一种扫描双光束干涉仪，特别是迈克尔逊干涉仪，其中干涉仪的至少一个光路（或臂）的长度可通过使用可旋转元件的旋转位移转换成的致动器来选择性地调节 使用形成干涉仪的光路的端部的至少一个反射表面的线性位移来获得从样品衰减，发射，散射或反射的电磁辐射的干涉图。 使用光学检测方案来确定调整的光路的长度，特别是在检测可旋转元件上的标记以确定反射表面的线性位移的情况下。