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公开(公告)号:US11121464B2
公开(公告)日:2021-09-14
申请号:US16806769
申请日:2020-03-02
Applicant: HUAWEI TECHNOLOGIES CO., LTD.
Inventor: Guangding Ge , Xubo Zhao , Deshuang Zhao
Abstract: This application discloses a correction and testing system, comprising a first phased array, a second phased array, and a test instrument, wherein the first phased array comprises a first radio frequency RF channel, the test instrument is configured to: determine, based on a coupling signal, an amplitude deviation value and a phase deviation value that correspond to the first RF channel; if the amplitude deviation value and the phase deviation value satisfy a preset error correction condition, correct an amplitude coefficient and a phase coefficient that correspond to the first RF channel to obtain a target amplitude coefficient and a target phase coefficient; and measure performance indicator parameters of the first phased array by using the target amplitude coefficient and the target phase coefficient. The correction and testing system can improve test efficiency, reducing a floor area, and lowering costs.