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    Inspection Systems and Methods
    5.
    发明公开
    Inspection Systems and Methods 审中-公开

    公开(公告)号：US20230281790A1

    公开(公告)日：2023-09-07

    申请号：US17684304

    申请日：2022-03-01

    Applicant: General Electric Company

    Inventor： Walter V. Dixon ,  James Vradenburg Miller

    IPC: G06T7/00

    CPC classification number: G06T7/001 ,  G06T2207/30164

    Abstract: Devices and methods are provided herein useful to aligning or linking together data from multiple inspections of a part. In some embodiments, the inspection methods include detecting key points on inspection data associated with the part, such as images. Key points provide the locations of features of interest on the part. Key points for the part are represented by feature descriptors. The inspection methods then link together data from two or more inspections by matching the feature descriptors and calculating a distance between matched key points. The inspection methods identify the proper alignment of inspection data from two or more inspections by identifying the alignment that achieves a minimum distance between matched key points on the inspection data. In this manner, the inspection methods align or link together inspection data from two or more different inspections to enable the comparative analysis of inspection data for a part.

    METHOD FOR INSPECTING AN OBJECT
    6.
    发明申请
    METHOD FOR INSPECTING AN OBJECT 有权

    公开(公告)号：US20230018554A1

    公开(公告)日：2023-01-19

    申请号：US17373925

    申请日：2021-07-13

    Applicant: General Electric Company ,  Oliver Crispin Robotics Limited

    Inventor： Andrew Crispin Graham ,  Julian Matthew Foxall ,  James Vradenburg Miller ,  Walter V. Dixon ,  Vijay Shirsat

    IPC: G06T7/564 ,  G06T17/20 ,  G01B11/25

    Abstract: A method for inspecting an object includes determining a first inspection package that includes a first inspection image of the object and a first designation. The method includes determining data indicative of a second inspection package that includes a second inspection image of the object and a second designation. The method includes determining a first property of the object based on the first inspection image of the object, one or more properties maps of the object, and the first designation. The method includes determining a second property of the object based on the second inspection image of the object, the one or more properties maps of the object, and the second designation. The method includes displaying the first property and the second property or displaying data indicative of a comparison of the first property with the second property.

    MACHINE LEARNING MODEL TRAINING CORPUS APPARATUS AND METHOD
    7.
    发明申请
    MACHINE LEARNING MODEL TRAINING CORPUS APPARATUS AND METHOD 有权

    公开(公告)号：US20250086944A1

    公开(公告)日：2025-03-13

    申请号：US18956574

    申请日：2024-11-22

    Applicant: General Electric Company

    Inventor： James Vradenburg Miller ,  Walter V. Dixon ,  Nihaar Shah

    IPC: G06V10/774 ,  G06T15/10

    Abstract: A control circuit accesses three-dimensional image information for a given three-dimensional object. The control circuit accesses a selection corresponding to a feature of the three-dimensional object, and then automatically generates a plurality of synthetic images of the three-dimensional object as a function of the three-dimensional and the selection of the aforementioned feature. By one approach, these synthetic images include supplemental visual emphasis corresponding to the aforementioned feature. The generated plurality of synthetic images can then be used as a training corpus when training a machine learning model.

    MACHINE LEARNING MODEL TRAINING CORPUS APPARATUS AND METHOD
    9.
    发明公开
    MACHINE LEARNING MODEL TRAINING CORPUS APPARATUS AND METHOD 审中-公开

    公开(公告)号：US20240029407A1

    公开(公告)日：2024-01-25

    申请号：US17871247

    申请日：2022-07-22

    Applicant: General Electric Company

    Inventor： James Vradenburg Miller ,  Walter V. Dixon ,  Nihaar Shah

    IPC: G06V10/774 ,  G06T15/10

    CPC classification number: G06V10/774 ,  G06T15/10

    Abstract: A control circuit accesses three-dimensional image information for a given three-dimensional object. The control circuit accesses a selection corresponding to a feature of the three-dimensional object, and then automatically generates a plurality of synthetic images of the three-dimensional object as a function of the three-dimensional and the selection of the aforementioned feature. By one approach, these synthetic images include supplemental visual emphasis corresponding to the aforementioned feature. The generated plurality of synthetic images can then be used as a training corpus when training a machine learning model.

    Machine learning model training corpus apparatus and method
    10.
    发明授权
    Machine learning model training corpus apparatus and method 有权

    公开(公告)号：US12165389B2

    公开(公告)日：2024-12-10

    申请号：US17871247

    申请日：2022-07-22

    Applicant: General Electric Company

    Inventor： James Vradenburg Miller ,  Walter V. Dixon ,  Nihaar Shah

    IPC: G06V10/774 ,  G06T15/10

    Abstract: A control circuit accesses three-dimensional image information for a given three-dimensional object. The control circuit accesses a selection corresponding to a feature of the three-dimensional object, and then automatically generates a plurality of synthetic images of the three-dimensional object as a function of the three-dimensional and the selection of the aforementioned feature. By one approach, these synthetic images include supplemental visual emphasis corresponding to the aforementioned feature. The generated plurality of synthetic images can then be used as a training corpus when training a machine learning model.

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