公开(公告)号：US09036886B2

公开(公告)日：2015-05-19

申请号：US14469821

申请日：2014-08-27

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Jiang Hsieh ,  Brian Edward Nett ,  Pavaana Sainath ,  Debashish Pal

IPC: G06K9/00 ,  G06T5/00 ,  G06T7/00 ,  G06T11/00 ,  G01N23/04

CPC classification number: G06T5/005 ,  A61B6/032 ,  A61B6/405 ,  A61B6/482 ,  A61B6/488 ,  A61B6/5205 ,  A61B6/5258 ,  G06T7/0012 ,  G06T11/005 ,  G06T2211/408

Abstract: A method is provided. The method includes acquiring a first dataset at a first energy spectrum and a second dataset at a second energy spectrum. The method also includes extracting a metal artifact correction signal using the first dataset and the second dataset or using a first reconstructed image and a second reconstructed image generated respectively from the first and the second datasets. The method further includes performing metal artifact correction on the first reconstructed image using the metal artifact correction signal to generate a first corrected image.

公开(公告)号：US20140363069A1

公开(公告)日：2014-12-11

申请号：US14469821

申请日：2014-08-27

Applicant: General Electric Company

Inventor： Jiang Hsieh ,  Brian Edward Nett ,  Pavaana Sainath ,  Debashish Pal

IPC: G06T5/00 ,  G06T7/00

CPC classification number: G06T5/005 ,  A61B6/032 ,  A61B6/405 ,  A61B6/482 ,  A61B6/488 ,  A61B6/5205 ,  A61B6/5258 ,  G06T7/0012 ,  G06T11/005 ,  G06T2211/408

Abstract: A method is provided. The method includes acquiring a first dataset at a first energy spectrum and a second dataset at a second energy spectrum. The method also includes extracting a metal artifact correction signal using the first dataset and the second dataset or using a first reconstructed image and a second reconstructed image generated respectively from the first and the second datasets. The method further includes performing metal artifact correction on the first reconstructed image using the metal artifact correction signal to generate a first corrected image.