Wafer identification fault recovery
    1.
    发明授权
    Wafer identification fault recovery 有权
    晶圆识别故障恢复

    公开(公告)号:US08811715B2

    公开(公告)日:2014-08-19

    申请号:US13644151

    申请日:2012-10-03

    Abstract: Described are computer-based methods and apparatuses, including computer program products, for wafer identification fault recovery. A digital image is received that includes a data symbol comprising a message encoded in a set of data cells. The digital image is processed to form a set of classified data cells, wherein one or more classified data cells from the set of classified data cells comprises an error. User interface data is transmitted comprising the digital image and interactive graphics, the interactive graphics including at least one data cell control. Interaction data is received from the interactive graphics that modifies a data cell location, a data cell state, or both, of at least one classified data cell from the set of classified data cells to form a modified set of classified data cells. An error free decoded message string is generated based on the modified set of classified data cells.

    Abstract translation: 描述了基于计算机的方法和装置,包括用于晶片识别故障恢复的计算机程序产品。 接收包括数据符号的数字图像,该数据符号包括编码在一组数据单元中的消息。 处理数字图像以形成一组分类的数据单元,其中来自分组数据单元组的一个或多个分类数据单元包括错误。 发送包括数字图像和交互式图形的用户界面数据,交互式图形包括至少一个数据单元控制。 交互式数据从交互式图形接收,该数据单元位置,数据单元状态或两者都来自分组数据单元集合中的​​至少一个分类数据单元,以形成经修改的分类数据单元组。 基于经修改的分类数据单元组生成无错译码消息串。

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