公开(公告)号：US20220005180A1

公开(公告)日：2022-01-06

申请号：US17479719

申请日：2021-09-20

Applicant: BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.

Inventor： Jingsi Zhu ,  Guochuan Deng ,  Taotao Zhao ,  Qingyu Kang ,  Yingjie Niu ,  Meng Wang

IPC: G06T7/00 ,  G06F16/29 ,  G06F16/535 ,  G06F16/538

Abstract: The disclosure discloses a method for assisting quality inspection of map data and an electronic device. The detailed implementation includes: obtaining at least one piece of map query data matching an area to be inspected; obtaining a first map image matching each piece of map query data by a first map client and obtaining a second map image matching each piece of map query data by a second map client, the first map client being adapted with map data to be online, and the second map client being adapted with online map data; and generating at least one pair of contrast images for quality inspection based on the first map image and the second map image, in which each pair of contrast images includes map images determined by the first map client and the second map client for the same map query data.