公开(公告)号：US20170082699A1

公开(公告)日：2017-03-23

申请号：US15272352

申请日：2016-09-21

Applicant: Apple Inc.

Inventor： John C. DIFONZO ,  Maurizio BERTOLDO

IPC: G01R33/12

CPC classification number: G01R33/0385

Abstract: An automated magnet quality measurement system includes a magnet measuring component and an automated magnet moving component. The magnet measuring component can be configured to measure EMF for a plurality of magnets. The automated magnet moving component can move each of the plurality of magnets into and out of the magnet measuring component without requiring any manual intervention, with only one of the plurality of magnets being within the magnet measuring component at a given time. The magnet measuring component can be a Helmholtz coil and the automated magnet moving component can be a rotating disk. The overall system can also include a loading system configured to load each of the magnets onto the automated magnet moving component on an individual and sequential basis, and a sorting system configured to sort the magnets based upon their EMF measurements.