公开(公告)号：US11215664B1

公开(公告)日：2022-01-04

申请号：US16906715

申请日：2020-06-19

Applicant: Apple Inc.

Inventor： Ke Yun ,  Weibiao Zhang ,  Bruno W. Garlepp ,  Gin S. Yee

IPC: G01R31/28 ,  G01R31/30

Abstract: An apparatus includes an integrated circuit that includes an in-circuit power switch coupled to a power supply node, a functional circuit coupled between the in-circuit power switch and a ground node, a test circuit, and a test power switch coupled to the test circuit, wherein the test power switch is a replica of the in-circuit power switch. The test circuit is configured to determine characteristics of the test power switch, and to measure a voltage difference across the in-circuit power switch. The test circuit is also configured to use the characteristics of the test power switch and the voltage difference to determine a power consumption of the functional circuit.

公开(公告)号：US20210396805A1

公开(公告)日：2021-12-23

申请号：US16906715

申请日：2020-06-19

Applicant: Apple Inc.

Inventor： Ke Yun ,  Weibiao Zhang ,  Bruno W. Garlepp ,  Gin S. Yee

IPC: G01R31/30 ,  G01R31/28

Abstract: An apparatus includes an integrated circuit that includes an in-circuit power switch coupled to a power supply node, a functional circuit coupled between the in-circuit power switch and a ground node, a test circuit, and a test power switch coupled to the test circuit, wherein the test power switch is a replica of the in-circuit power switch. The test circuit is configured to determine characteristics of the test power switch, and to measure a voltage difference across the in-circuit power switch. The test circuit is also configured to use the characteristics of the test power switch and the voltage difference to determine a power consumption of the functional circuit.