公开(公告)号：US08618511B2

公开(公告)日：2013-12-31

申请号：US12212874

申请日：2008-09-18

Applicant: Josef K. Röper ,  Werner Finke ,  Martin Frank ,  Günter Schmidt ,  Siegfried Dick ,  Peter Stubenbord

Inventor： Josef K. Röper ,  Werner Finke ,  Martin Frank ,  Günter Schmidt ,  Siegfried Dick ,  Peter Stubenbord

IPC: G01N21/00

CPC classification number: G21K5/00 ,  G01N33/48764 ,  G01N35/00029 ,  G01N35/00732 ,  G01N2035/00108 ,  G01N2035/00168

Abstract: The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.

Abstract translation: 提供了适于检测样品中的至少一种分析物的测试元件。 至少一些测试元件被提供有缺陷标记，该缺陷标记包含关于测试元件的缺陷的信息。 测试元件包括至少一种辐射敏感材料。 测试元件暴露于至少一个辐射，辐射适于以辐射敏感材料中的至少一个可光学检测的变化的形式诱导标记。

公开(公告)号：US20090090874A1

公开(公告)日：2009-04-09

申请号：US12212874

申请日：2008-09-18

Applicant: Josef K. Roper ,  Werner Finke ,  Martin Frank ,  Gunter Schmidt ,  Siegfried Dick ,  Peter Stubenbord

Inventor： Josef K. Roper ,  Werner Finke ,  Martin Frank ,  Gunter Schmidt ,  Siegfried Dick ,  Peter Stubenbord

IPC: H05B33/00 ,  G01N21/00

CPC classification number: G21K5/00 ,  G01N33/48764 ,  G01N35/00029 ,  G01N35/00732 ,  G01N2035/00108 ,  G01N2035/00168

Abstract: The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.

Abstract translation: 提供了适于检测样品中的至少一种分析物的测试元件。 至少一些测试元件被提供有缺陷标记，该缺陷标记包含关于测试元件的缺陷的信息。 测试元件包括至少一种辐射敏感材料。 测试元件暴露于至少一个辐射，辐射适于以辐射敏感材料中的至少一个可光学检测的变化的形式诱导标记。