Invention Grant
- Patent Title: Methods for forming low-resistance contacts through integrated process flow systems
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Application No.: US15358690Application Date: 2016-11-22
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Publication No.: US09947578B2Publication Date: 2018-04-17
- Inventor: Yu Lei , Vikash Banthia , Kai Wu , Xinyu Fu , Yi Xu , Kazuya Daito , Feiyue Ma , Pulkit Agarwal , Chi-Chou Lin , Dien-Yeh Wu , Guoqiang Jian , Wei V. Tang , Jonathan Bakke , Mei Chang , Sundar Ramamurthy
- Applicant: APPLIED MATERIALS, INC.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser Taboada
- Agent Alan Taboada
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H01L21/768 ; C23C16/44 ; C23C16/455 ; C23C16/46 ; C23C16/52 ; H01L21/311 ; C23C16/02 ; C23C16/04 ; C23C16/06 ; C23C16/08 ; C23C16/505 ; C23C16/54

Abstract:
Methods for forming metal contacts having tungsten liner layers are provided herein. In some embodiments, a method of processing a substrate includes: exposing a substrate, within a first substrate process chamber, to a plasma formed from a first gas comprising a metal organic tungsten precursor gas or a fluorine-free tungsten halide precursor to deposit a tungsten liner layer, wherein the tungsten liner layer is deposited atop a dielectric layer and within a feature formed in a first surface of the dielectric layer of a substrate; transferring the substrate to a second substrate process chamber without exposing the substrate to atmosphere; and exposing the substrate to a second gas comprising a tungsten fluoride precursor to deposit a tungsten fill layer atop the tungsten liner layer.
Public/Granted literature
- US20170148670A1 METHODS FOR FORMING LOW-RESISTANCE CONTACTS THROUGH INTEGRATED PROCESS FLOW SYSTEMS Public/Granted day:2017-05-25
Information query
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