- 专利标题: Fitting sample points with an isovalue surface
-
申请号: US14684147申请日: 2015-04-10
-
公开(公告)号: US09928314B2公开(公告)日: 2018-03-27
- 发明人: David Leo Bonner
- 申请人: DASSAULT SYSTEMES
- 申请人地址: FR Velizy Villacoublay
- 专利权人: DASSAULT SYSTEMES
- 当前专利权人: DASSAULT SYSTEMES
- 当前专利权人地址: FR Velizy Villacoublay
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: EP14305529 20140410
- 主分类号: G06F17/50
- IPC分类号: G06F17/50 ; G06F17/10 ; G06T17/00 ; G06T15/08 ; G06F17/17
摘要:
The invention notably relates to a computer-implemented method for designing a three-dimensional modeled object that represents a physical entity. The method comprises providing sample points; determining a volumetric function, within a predetermined class of volumetric functions, as the optimum of an optimization program that explores orientation vectors defined at the sample points, wherein the optimization program penalizes a distance from the explored orientation vectors; and fitting the sample points with an isovalue surface of the volumetric function, wherein the program further penalizes oscillations of the fitted isovalue surface.
公开/授权文献
- US20150294036A1 FITTING SAMPLE POINTS WITH AN ISOVALUE SURFACE 公开/授权日:2015-10-15
信息查询