Invention Grant
- Patent Title: Multi-layer range measurement apparatus for characterizing charged particle beams
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Application No.: US15250012Application Date: 2016-08-29
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Publication No.: US09901751B1Publication Date: 2018-02-27
- Inventor: Raymond P. Boisseau , John S. Gordon , Andrew Dart , Julia C. Nett
- Applicant: Pyramid Technical Consultants Inc.
- Applicant Address: US MA Lexington
- Assignee: Pyramid Technical Consultants, Inc.
- Current Assignee: Pyramid Technical Consultants, Inc.
- Current Assignee Address: US MA Lexington
- Agency: Intrinsic Law Corp.
- Main IPC: A61N5/10
- IPC: A61N5/10 ; H05K5/02 ; H05K5/00 ; H05K5/04 ; H05K9/00 ; H01J37/24

Abstract:
A multi-layer charged particle beam characterization system is disclosed, and method for using the same. A typical embodiment includes a plurality of two-sided metal plates, arranged as a stack, each metal plate having an electrical contact tab extending from at least one common edge of the metal plate, and a plurality of insulator films disposed between adjacent metal plates, each insulator film sized to match its corresponding metal plate. The tabs are coupled to a printed circuit board and connected to an external electrical connector to register a number of metal plates and insulator layers through which a charged particle beam has penetrated.
Public/Granted literature
- US20180056094A1 Multi-Layer Range Measurement Apparatus for Characterizing Charged Particle Beams Public/Granted day:2018-03-01
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