- 专利标题: Substrate bonding apparatus and substrate bonding method
-
申请号: US15306303申请日: 2015-04-24
-
公开(公告)号: US09870922B2公开(公告)日: 2018-01-16
- 发明人: Tadatomo Suga , Akira Yamauchi
- 申请人: Tadatomo Suga , BONDTECH CO., LTD.
- 申请人地址: JP JP
- 专利权人: Tadatomo Suga,BONDTECH CO., LTD.
- 当前专利权人: Tadatomo Suga,BONDTECH CO., LTD.
- 当前专利权人地址: JP JP
- 代理机构: Ostrolenk Faber LLP
- 优先权: JP2014-091929 20140425; JP2014-214869 20141021; JP2014-221771 20141030
- 国际申请: PCT/JP2015/062591 WO 20150424
- 国际公布: WO2015/163461 WO 20151029
- 主分类号: H01L21/18
- IPC分类号: H01L21/18 ; B23K20/00 ; H01L21/02 ; H05H1/46 ; H05H3/02 ; H01J37/32
摘要:
A substrate bonding apparatus (100) includes a vacuum chamber (200), a surface activation part (610) for activating respective bonding surfaces of a first substrate (301) and a second substrate (302), and stage moving mechanisms (403, 404) for bringing the two bonding surfaces into contact with each other, to thereby bond the substrates (301, 302). In order to activate the bonding surfaces in the vacuum chamber (200), the bonding surfaces are irradiated with a particle beam for activating the bonding surfaces, and concurrently the bonding surfaces are also irradiated with silicon particles. It is thereby possible to increase the bonding strength of the substrates (301, 302).
公开/授权文献
- US20170047225A1 SUBSTRATE BONDING APPARATUS AND SUBSTRATE BONDING METHOD 公开/授权日:2017-02-16
信息查询
IPC分类: