- 专利标题: Manufacture modeling and monitoring
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申请号: US14211600申请日: 2014-03-14
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公开(公告)号: US09864366B2公开(公告)日: 2018-01-09
- 发明人: Joseph M. Kesler , Thomas D. Sharp , Uriah M. Liggett , Brian Bahr , Chris M. Hodapp , Gary E. Coyan
- 申请人: Etegent Technologies Ltd.
- 申请人地址: US OH Cincinnati
- 专利权人: Etegent Technologies Ltd.
- 当前专利权人: Etegent Technologies Ltd.
- 当前专利权人地址: US OH Cincinnati
- 代理机构: Wood Herron & Evans LLP
- 主分类号: G06F17/50
- IPC分类号: G06F17/50 ; G05B19/418 ; G06Q10/06 ; G06Q50/04 ; B64F5/60
摘要:
Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
公开/授权文献
- US20140277662A1 MANUFACTURE MODELING AND MONITORING 公开/授权日:2014-09-18
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