Invention Grant
- Patent Title: Microparticle detection device and security gate
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Application No.: US14402959Application Date: 2013-04-30
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Publication No.: US09850696B2Publication Date: 2017-12-26
- Inventor: Masakazu Sugaya , Koichi Terada , Hideo Kashima , Yasuaki Takada , Hisashi Nagano
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2012-117617 20120523
- International Application: PCT/JP2013/062581 WO 20130430
- International Announcement: WO2013/175947 WO 20131128
- Main IPC: E05F15/00
- IPC: E05F15/00 ; H01J49/04 ; E05F15/40 ; G01N1/22 ; E05F15/72 ; E05G7/00 ; E06B5/10 ; G01N1/02 ; G01N33/22 ; G01N15/00 ; E05G5/00

Abstract:
In a conventional fine particle detection device that vaporizes fine particles attached to the object of examination by heating, processing capability decreases as the processing time elapses due to the influence of deposition of fine particles other than the object of examination, dirt/dust, a residue of the fine particles as the object of examination, or residual matter. A fine particle detection device according to the present invention includes: a vaporization device that vaporizes the fine particles trapped by a trap device by vaporization or decomposition; a first flow passageway in which a mixture of a component vaporized by the vaporization device and another component flows; a second flow passageway branching from the first flow passageway in a direction of inertial force acting on the other component; a third flow passageway branching from the first flow passageway in a direction different from the direction of the inertial force; and an analysis device that analyzes a component introduced into the third flow passageway.
Public/Granted literature
- US20150136975A1 Microparticle Detection Device and Security Gate Public/Granted day:2015-05-21
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