- Patent Title: Metal oxide thin film transistor having channel protection layer
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Application No.: US14771526Application Date: 2014-10-30
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Publication No.: US09793413B2Publication Date: 2017-10-17
- Inventor: Li Zhang , Meili Wang , Fengjuan Liu
- Applicant: BOE Technology Group Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: BOE Technology Group Co., Ltd.
- Current Assignee: BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Westman, Champlin & Koehler, P.A.
- Priority: CN201410437600 20140829
- International Application: PCT/CN2014/089891 WO 20141030
- International Announcement: WO2016/029541 WO 20160303
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L27/12 ; H01L29/66 ; H01L27/32

Abstract:
The present disclosure provides a method for producing a thin film transistor. The method includes the steps of: forming a protective layer on an active layer of the thin film transistor and patterning the protective layer along with the active layer when the active layer is deposited; depositing a source and drain electrode layer and patterning it by a dry etching to form a source electrode and a drain electrode; and etching or passivating the protective layer located in a back channel region of the source electrode and the drain electrode. In addition, the present disclosure also discloses a thin film transistor produced by the above method, and an array substrate.
Public/Granted literature
- US20170005198A1 THIN FILM TRANSISTOR, METHOD OF PRODUCING THE SAME AND ARRAY SUBSTRATE Public/Granted day:2017-01-05
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