- 专利标题: Method for forming tunnel MOSFET with ferroelectric gate stack
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申请号: US15195620申请日: 2016-06-28
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公开(公告)号: US09768030B2公开(公告)日: 2017-09-19
- 发明人: Min-Hung Lee
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd. , National Taiwan University
- 申请人地址: TW Hsin-Chu TW Taipei
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.,National Taiwan University
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.,National Taiwan University
- 当前专利权人地址: TW Hsin-Chu TW Taipei
- 代理机构: Slater Matsil, LLP
- 主分类号: H01L21/28
- IPC分类号: H01L21/28 ; H01L29/51 ; H01L29/66 ; H01L21/02 ; H01L29/739 ; H01L21/8234 ; H01L21/8238 ; H01L29/10 ; H01L29/78
摘要:
A Tunnel Field-Effect Transistor (TFET) includes a source region in a semiconductor substrate, and a drain region in the semiconductor substrate. The source region and the drain region are of opposite conductivity types. The TFET further includes a gate stack over the semiconductor substrate, with the source region and the drain region extending to opposite sides of the gate stack. The gate stack includes a gate dielectric over the semiconductor substrate, and a ferroelectric layer over the gate dielectric.
公开/授权文献
- US20160308021A1 Tunnel MOSFET with Ferroelectric Gate Stack 公开/授权日:2016-10-20
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