Invention Grant
- Patent Title: Substrate including selectively formed barrier layer
-
Application No.: US14828608Application Date: 2015-08-18
-
Publication No.: US09748135B2Publication Date: 2017-08-29
- Inventor: Yuri M. Brovman , Brian M. Erwin , Nicholas A. Polomoff , Jennifer D. Schuler , Matthew E. Souter , Christopher L. Tessler
- Applicant: International Business Machines Corporation , SUSS MicroTec Photonic Systems Inc.
- Applicant Address: US NY Armonk US CA Corona
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,SUSS MICROTEC PHOTONIC SYSTEMS INC.
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION,SUSS MICROTEC PHOTONIC SYSTEMS INC.
- Current Assignee Address: US NY Armonk US CA Corona
- Agency: Cantor Colburn LLP
- Agent Steven Meyers
- Main IPC: H01L21/768
- IPC: H01L21/768

Abstract:
A method of selectively locating a barrier layer on a substrate includes forming a barrier layer on a surface of the substrate. The barrier layer comprises of a metal element and a non-metal element. The barrier layer may also be formed from a metal element and non-metal element. The method further includes forming an electrically conductive film layer on the barrier layer, and forming a metallic portion in the electrically conductive film layer. The method further includes selectively ablating portions of the barrier layer from the dielectric layer to selectively locate place the barrier layer on the substrate.
Public/Granted literature
- US20150357235A1 SUBSTRATE INCLUDING SELECTIVELY FORMED BARRIER LAYER Public/Granted day:2015-12-10
Information query
IPC分类: