- 专利标题: Examining apparatus, examining method and image recording apparatus
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申请号: US15254679申请日: 2016-09-01
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公开(公告)号: US09718292B2公开(公告)日: 2017-08-01
- 发明人: Yosuke Kimura
- 申请人: FUJIFILM Corporation
- 申请人地址: JP Tokyo
- 专利权人: FUJIFILM Corporation
- 当前专利权人: FUJIFILM Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: JP2015-172800 20150902
- 主分类号: B41J29/393
- IPC分类号: B41J29/393 ; H04N1/00 ; B41J2/01
摘要:
An examining apparatus, examining method and an image recording apparatus which analyze the state of a print image irrespective of variation in contrast performance of an optical unit of a reading device are provided. An examining apparatus includes: a reading device configured to read an image recorded by a recording head to output a reading result and including at least one optical unit including an image capturing element and a lens; an analyzing device configured to analyze a state of the recording head or a state of the image by comparing the reading result to a threshold; an index acquiring device configured to acquire an index indicating contrast performance for each divided reading region obtained by dividing a reading region of the reading device into a plurality of regions; and a correcting device configured to correct the threshold for the divided reading region based on the acquired index.
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