发明授权
- 专利标题: Plate and dual side wafer grinding device including same
- 专利标题(中): 板和双面晶圆磨削装置包括它
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申请号: US14761930申请日: 2014-01-20
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公开(公告)号: US09592584B2公开(公告)日: 2017-03-14
- 发明人: Dae-Hoon Kim
- 申请人: LG SILTRON INC.
- 申请人地址: KR Gyeongsangbuk-Do
- 专利权人: LG SILTRON INC.
- 当前专利权人: LG SILTRON INC.
- 当前专利权人地址: KR Gyeongsangbuk-Do
- 代理机构: Lewis Roca Rothgerber Christie LLP
- 优先权: KR10-2013-0006040 20130118
- 国际申请: PCT/KR2014/000564 WO 20140120
- 国际公布: WO2014/112845 WO 20140724
- 主分类号: B24B37/08
- IPC分类号: B24B37/08 ; H01L21/67 ; B24B37/16
摘要:
An embodiment of the present invention provides a surface plate provided at a wafer double-side grinding device for grinding a wafer. The surface plate includes a plurality of first surface plate grooves formed in a first direction, and a plurality of second surface plate grooves formed in a second direction different from the first direction. The first surface plate grooves and the second surface plate grooves have first and second surface plate groove portions arranged therein, the first and second surface plate groove portions having steps formed in a direction toward the center or an outer periphery of a lower surface plate.
公开/授权文献
- US20150352684A1 PLATE AND DUAL SIDE WAFER GRINDING DEVICE INCLUDING SAME 公开/授权日:2015-12-10
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