Invention Grant
US09583323B2 Use of variable XIC widths of TOF-MSMS data for the determination of background interference in SRM assays
有权
使用TOF-MSMS数据的可变XIC宽度来确定SRM测定中的背景干扰
- Patent Title: Use of variable XIC widths of TOF-MSMS data for the determination of background interference in SRM assays
- Patent Title (中): 使用TOF-MSMS数据的可变XIC宽度来确定SRM测定中的背景干扰
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Application No.: US14123185Application Date: 2012-05-30
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Publication No.: US09583323B2Publication Date: 2017-02-28
- Inventor: Stephen A. Tate , David M. Cox
- Applicant: Stephen A. Tate , David M. Cox
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Kasha Law LLC
- Agent John R. Kasha; Kelly L. Kasha
- International Application: PCT/IB2012/001049 WO 20120530
- International Announcement: WO2012/164375 WO 20121206
- Main IPC: H01J49/02
- IPC: H01J49/02 ; H01J49/00 ; G06F19/00

Abstract:
Systems and methods identify a product ion that does not include an interference. A full product ion spectrum for a mass range of an analyte in a sample is received from a tandem mass spectrometer. A first set of one or more peak parameters is calculated for a product ion in the full product ion spectrum using a first XIC window width. A second set of one or more peak parameters is calculated for the product ion using a second XIC window width. The product ion is identified as not including an interference, if the first set of one or more peak parameters and the second set of one or more peak parameters are substantially the same. The product ion is further confirmed or determined to be from the analyte and not from a matrix of the sample by correlating the product to a precursor ion of the analyte.
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