发明授权
- 专利标题: X-ray detector and method of manufacturing the same
- 专利标题(中): X射线检测器及其制造方法
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申请号: US14704529申请日: 2015-05-05
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公开(公告)号: US09566035B2公开(公告)日: 2017-02-14
- 发明人: Changbum Lee , Sunil Kim , Dongwook Lee , Jaechul Park
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2014-0138615 20141014
- 主分类号: G01T1/24
- IPC分类号: G01T1/24 ; A61B6/00 ; G01T1/17 ; G01T7/00 ; A61B6/04
摘要:
A method of manufacturing an X-ray detector includes: applying a mask having an opening on a substrate on which a plurality of charge detection units are positioned; filling the opening with a paste including a photoelectric conversion material that absorbs X-rays to generate charges; and forming a photoconductive layer from the paste by separating the mask from the substrate. A thickness of the paste within the opening is thicker in an area adjacent to at least one edge among edges of the opening than in areas around other edges.
公开/授权文献
- US20160100812A1 X-RAY DETECTOR AND METHOD OF MANUFACTURING THE SAME 公开/授权日:2016-04-14
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