Invention Grant
US09551671B2 Method and device for detecting, in particular, refracting defects
有权
用于检测特别是折射缺陷的方法和装置
- Patent Title: Method and device for detecting, in particular, refracting defects
- Patent Title (中): 用于检测特别是折射缺陷的方法和装置
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Application No.: US14416369Application Date: 2013-07-18
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Publication No.: US09551671B2Publication Date: 2017-01-24
- Inventor: Olivier Colle , Florence Drouet , Marc Leconte
- Applicant: MSC & SGCC
- Applicant Address: FR Vourles
- Assignee: MSC & SGCC
- Current Assignee: MSC & SGCC
- Current Assignee Address: FR Vourles
- Agency: Clark & Brody
- Priority: FR1257117 20120723
- International Application: PCT/FR2013/051740 WO 20130718
- International Announcement: WO2014/016500 WO 20140130
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/90 ; G01N21/958 ; G01N21/88

Abstract:
An in-line method for optically inspecting transparent or translucent containers (3) comprises illuminating each container with a light source that presents light intensity variation in a periodic pattern along at least a first variation direction. A number N greater than or equal to three of images of the container traveling in front of the light source and occupying N different respective positions along the travel path is taken. Between taking successive images, a relative shift between the container and the periodic pattern is created. A geometrical transformation is determined and applied in order to put the pixels belonging to the container in the N successive images of the same container into coincidence. A phase image for each container is constructed using the N registered images of the container. The phase image is analyzed in order to deduce therefrom at least the presence of defects or the quality of the container.
Public/Granted literature
- US20150204797A1 METHOD AND DEVICE FOR DETECTING, IN PARTICULAR, REFRACTING DEFECTS Public/Granted day:2015-07-23
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