发明授权
- 专利标题: Automatic analyzer
- 专利标题(中): 自动分析仪
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申请号: US14124005申请日: 2012-06-04
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公开(公告)号: US09529009B2公开(公告)日: 2016-12-27
- 发明人: Hidetsugu Tanoue , Kazuhiro Tanaka
- 申请人: Hidetsugu Tanoue , Kazuhiro Tanaka
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2011-126427 20110606
- 国际申请: PCT/JP2012/064408 WO 20120604
- 国际公布: WO2012/169469 WO 20121213
- 主分类号: G01N35/10
- IPC分类号: G01N35/10 ; G01F23/26
摘要:
An automatic analyzer uses probes for detecting liquid levels based on a capacitance detection method. Erroneous detection of liquid levels due to interference caused by the frequency difference of oscillators is reducted. When frequencies f1 and f2 of respective detector oscillators, which are originally equal to each other, are different by approximately several Hz from each other due to a manufacturing variation, oscillation waveforms are added to liquid level detection voltages, causing a premature determination that the probes have contacted the liquid surface before actual contact therewith. By setting the difference between the frequencies f1 and f2 of the detector oscillators to be in the range of several kHz, an oscillation waveform corresponding to the difference between the frequencies is added to the detection voltages, but the amplitude values of the high-frequency components are attenuated by high-frequency attenuators, thereby ensuring accuracy in the liquid level detection.
公开/授权文献
- US20140123774A1 AUTOMATIC ANALYZER 公开/授权日:2014-05-08
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