Invention Grant
- Patent Title: Inspecting apparatus for inspecting a multilayer structure
- Patent Title (中): 用于检查多层结构的检查装置
-
Application No.: US14530952Application Date: 2014-11-03
-
Publication No.: US09488598B2Publication Date: 2016-11-08
- Inventor: Wal Jun Kim , Seung Young Baeck
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2014-0066941 20140602
- Main IPC: G01N21/84
- IPC: G01N21/84 ; G01N21/94 ; G01N21/88 ; G01N21/958

Abstract:
An inspecting apparatus includes: a stage including a top surface on which a multilayer structure comprising a first layer and a second layer is placed; a first light irradiation unit which faces a first side surface of the multilayer structure and provides light to a first side surface of the first layer or a first side surface of the second layer; an image capture unit which is on the stage, receives scattered light from the multilayer structure and generates image information of the multilayer structure from the received scattered light, and a control unit which detects foreign body information of the multilayer structure based on the image information of the multilayer structure. The scattered light comprises the light which is provided from the first light irradiation unit and is scattered within the multilayer structure.
Public/Granted literature
- US20150346107A1 INSPECTING APPARATUS FOR INSPECTING A MULTILAYER STRUCTURE Public/Granted day:2015-12-03
Information query