Invention Grant
- Patent Title: Enhanced stacked microelectronic assemblies with central contacts
- Patent Title (中): 具有中心触点的增强堆叠微电子组件
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Application No.: US14270885Application Date: 2014-05-06
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Publication No.: US09461015B2Publication Date: 2016-10-04
- Inventor: Belgacem Haba , Wael Zohni , Richard Dewitt Crisp
- Applicant: Tessera, Inc.
- Applicant Address: US CA San Jose
- Assignee: Tessera, Inc.
- Current Assignee: Tessera, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: KR10-2010-0129890 20101217
- Main IPC: H05K1/11
- IPC: H05K1/11 ; H01L25/065 ; H01L23/13 ; H01L23/498 ; H01L25/10 ; H01L23/31 ; H01L23/00 ; H01L27/146

Abstract:
A microelectronic assembly includes a dielectric element having first and second surfaces, first and second apertures extending between the first and second surfaces and defining a central region of the first surface between the first and second apertures, first and second microelectronic elements, and leads extending from contacts exposed at respective front surfaces of the first and second microelectronic elements to central terminals exposed at the central region. The front surface of the first microelectronic element can face the second surface of the dielectric element. The front surface of the second microelectronic element can face a rear surface of the first microelectronic element. The contacts of the second microelectronic element can project beyond an edge of the first microelectronic element. At least first and second ones of the leads can electrically interconnect a first central terminal of the central terminals with each of the first and second microelectronic elements.
Public/Granted literature
- US20140239513A1 ENHANCED STACKED MICROELECTRONIC ASSEMBLIES WITH CENTRAL CONTACTS Public/Granted day:2014-08-28
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