发明授权
US09417345B2 Method for calibrating a counting digital X-ray detector, X-ray system for performing such a method and method for acquiring an X-ray image 有权
用于校准计数数字X射线检测器的方法,用于执行用于获取X射线图像的方法和方法的X射线系统

  • 专利标题: Method for calibrating a counting digital X-ray detector, X-ray system for performing such a method and method for acquiring an X-ray image
  • 专利标题(中): 用于校准计数数字X射线检测器的方法,用于执行用于获取X射线图像的方法和方法的X射线系统
  • 申请号: US14146564
    申请日: 2014-01-02
  • 公开(公告)号: US09417345B2
    公开(公告)日: 2016-08-16
  • 发明人: Silke ReitzMartin Spahn
  • 申请人: Silke ReitzMartin Spahn
  • 申请人地址: DE München
  • 专利权人: Siemens Aktiengesellschaft
  • 当前专利权人: Siemens Aktiengesellschaft
  • 当前专利权人地址: DE München
  • 代理机构: Lempia Summerfield Katz LLC
  • 优先权: DE102013200021 20130102
  • 主分类号: G01T7/00
  • IPC分类号: G01T7/00 G01T1/24
Method for calibrating a counting digital X-ray detector, X-ray system for performing such a method and method for acquiring an X-ray image
摘要:
A method for calibrating a counting digital X-ray detector includes performing a threshold value scan in at least one defined X-ray spectrum for irradiating the X-ray detector, which includes a matrix composed of pixel elements, storing count rates of the pixel elements as a function of respective applied threshold values, and from results of a measurement of count rates of the pixel elements, determining or calculating individual correction threshold values for the individual pixel elements. The individual correction threshold values correct a threshold value that is to be applied to the pixel elements for the defined X-ray spectrum such that threshold value noise is reduced.
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