- 专利标题: Full-field maskless lithography projection optics
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申请号: US13538287申请日: 2012-06-29
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公开(公告)号: US09411246B2公开(公告)日: 2016-08-09
- 发明人: David Michael Williamson
- 申请人: David Michael Williamson
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Quarles & Brady, LLP
- 代理商 Yakov Sidorin
- 主分类号: G02F1/29
- IPC分类号: G02F1/29 ; G03F7/20
摘要:
Projection optics for a lithographic projection system is provided that comprises a spatial light modulator (SLM) from which radiation is reflected and directed to a projection lens that projects the radiation to a substrate. The SLM is illuminated by non telecentric off axis illumination (e.g. from laser radiation that has a spectral bandwidth of the order of 1 picometer, and the projection optics is configured for significant reduction (e.g. at least 10× reduction, 20× reduction, or 50× reduction).
公开/授权文献
- US20130003166A1 Full-field maskless lithography projection optics 公开/授权日:2013-01-03
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