Invention Grant
- Patent Title: Contact probe and probe unit
- Patent Title (中): 接触探头和探头单元
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Application No.: US13806444Application Date: 2011-06-23
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Publication No.: US09404941B2Publication Date: 2016-08-02
- Inventor: Toshio Kazama , Kazuya Souma , Akihiro Matsui
- Applicant: Toshio Kazama , Kazuya Souma , Akihiro Matsui
- Applicant Address: JP Yokohama-shi
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama-shi
- Agency: Locke Lord LLP
- Priority: JP2010-145639 20100625; JP2010-254784 20101115
- International Application: PCT/JP2011/064485 WO 20110623
- International Announcement: WO2011/162362 WO 20111229
- Main IPC: G01R1/067
- IPC: G01R1/067 ; H01L23/00 ; G01R1/073 ; H05K7/10 ; H01R13/24

Abstract:
A contact probe includes a conductive first plunger including, on a same axis, a distal end portion, a flange portion, a boss portion, and a base end portion, a conductive second plunger including, on the same axis, a second distal end portion and a boss portion, and a coil spring including a coarsely wound portion formed by winding at a predetermined pitch with an inner diameter equal to or larger than a diameter of the boss portion of the first plunger and a tightly wound portion formed by tightly winding with an inner diameter substantially equal to a diameter of the boss portion of the second plunger, so that the first plunger and the second plunger are connected to each other on the same axis.
Public/Granted literature
- US20130099814A1 CONTACT PROBE AND PROBE UNIT Public/Granted day:2013-04-25
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