发明授权
- 专利标题: Automatic analyzer
- 专利标题(中): 自动分析仪
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申请号: US14238205申请日: 2012-07-19
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公开(公告)号: US09389240B2公开(公告)日: 2016-07-12
- 发明人: Kenichi Takahashi , Isao Yamazaki
- 申请人: Kenichi Takahashi , Isao Yamazaki
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2011-194356 20110906
- 国际申请: PCT/JP2012/068385 WO 20120719
- 国际公布: WO2013/035444 WO 20130314
- 主分类号: G01N35/10
- IPC分类号: G01N35/10 ; G01N35/02 ; G01N35/04
摘要:
An automatic analyzer adapted to enhance sample/reagent dispensing accuracy, regardless of a difference in sample/reagent dispensing height of a dispensing probe. When the amount of sample in a sample container is small, tip height “h1” of a sample dispensing probe positioned immediately after it has aspirated the sample decreases below tip height “h′” of the sample dispensing probe positioned immediately before it discharges the sample. The sample in this state takes a concave shape at the tip of the sample dispensing probe positioned immediately before it discharges the sample. When the amount of sample in a sample container is large, tip height “h2” of the sample dispensing probe positioned immediately after it has aspirated the sample increases above the tip height “h′” and the sample takes a convex shape at the tip of the sample dispensing probe positioned immediately before it discharges the sample.
公开/授权文献
- US20140193918A1 AUTOMATIC ANALYZER 公开/授权日:2014-07-10
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