发明授权
US09383618B2 Semiconductor structures for enhanced transient response in low dropout (LDO) voltage regulators
有权
用于在低压差(LDO)稳压器中增强瞬态响应的半导体结构
- 专利标题: Semiconductor structures for enhanced transient response in low dropout (LDO) voltage regulators
- 专利标题(中): 用于在低压差(LDO)稳压器中增强瞬态响应的半导体结构
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申请号: US14336870申请日: 2014-07-21
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公开(公告)号: US09383618B2公开(公告)日: 2016-07-05
- 发明人: Gwilym Luff
- 申请人: INTERSIL AMERICAS LLC
- 申请人地址: US CA Milpitas
- 专利权人: Intersil Americas LLC
- 当前专利权人: Intersil Americas LLC
- 当前专利权人地址: US CA Milpitas
- 代理机构: Fogg & Powers LLC
- 主分类号: G05F3/02
- IPC分类号: G05F3/02 ; G02F1/1368 ; G05F1/56
摘要:
Systems, semiconductor structures, electronic circuits and methods for enhanced transient response in Low Dropout (LDO) voltage regulators are disclosed. For example, a semiconductor structure for enhanced transient response in an LDO voltage regulator is disclosed, which includes a first current mirror circuit coupled to an input connection and an output connection of the LDO voltage regulator, a second current mirror circuit coupled to the input connection of the LDO voltage regulator. A first input of a first amplifier circuit is coupled to the second current mirror circuit, a second input of the first amplifier circuit is coupled to the output connection of the LDO voltage regulator, and a third input of the first amplifier circuit is coupled to a reference voltage. An input of a second amplifier circuit is coupled to an output of the first amplifier circuit, an output of the second amplifier circuit is coupled to the first current mirror circuit, an input of a third amplifier circuit is coupled to the output of the first amplifier circuit, and an output of the third amplifier circuit is coupled to the second current mirror circuit. In some implementations, the semiconductor structure is an adaptively-biased LDO voltage regulator formed in a power management integrated circuit (PMIC) or in a power supply on a semiconductor IC, wafer, chip or die.
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