Invention Grant
- Patent Title: System and method for multi-material correction of image data
- Patent Title (中): 图像数据多物质校正的系统和方法
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Application No.: US14535017Application Date: 2014-11-06
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Publication No.: US09374565B2Publication Date: 2016-06-21
- Inventor: Hewei Gao , Girijesh Kumar Yadava , Adam Israel Cohen , Yannan Jin
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Pabrita K. Chakrabarti
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N9/31 ; G06T7/00 ; G06T3/00 ; G06T5/00

Abstract:
A method includes acquiring projection data of an object from a plurality of detector elements, reconstructing the acquired projection data into a first reconstructed image, and performing material characterization of an image volume of the first reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. Performing material characterization includes utilizing a generalized modeling function to estimate a fraction of at least one basis material within each voxel of the image volume. The method also includes generating a re-mapped image volume for the at least one basis material of the two basis materials, performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection, and generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials.
Public/Granted literature
- US20160134852A1 SYSTEM AND METHOD FOR MULTI-MATERIAL CORRECTION OF IMAGE DATA Public/Granted day:2016-05-12
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