Invention Grant
- Patent Title: Polarized millimeter wave imaging system and method
- Patent Title (中): 极化毫米波成像系统及方法
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Application No.: US14156095Application Date: 2014-01-15
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Publication No.: US09330330B2Publication Date: 2016-05-03
- Inventor: Mostafa A. Karam , Kent Anderson , Raj K. Shori , A. Douglas Meyer
- Applicant: Mostafa A. Karam , Kent Anderson , Raj K. Shori , A. Douglas Meyer
- Applicant Address: US VA Falls Church
- Assignee: Northrop Grumman Systems Corporation
- Current Assignee: Northrop Grumman Systems Corporation
- Current Assignee Address: US VA Falls Church
- Agency: Tarolli, Sundheim, Covell & Tummino LLP
- Main IPC: G01S13/89
- IPC: G01S13/89 ; G01J5/60 ; G06K9/46 ; G01K11/00 ; G01S7/499 ; G06K9/00 ; G01S13/00 ; G01J5/00

Abstract:
A detection system includes a polarization analyzer that generates one or more null detection values if an object is sensed in a received millimeter wave (MMW) brightness temperature data set. The polarization analyzer analyzes a polarization parameter in the received MMW brightness temperature data set to generate the one or more null detection values. An object detector detects if the object is present based on a comparison of the one or more null detection values to a predetermined threshold. A singular value decomposition (SVD) unit is enabled by the object detector to decompose the MMW brightness temperature data set into a plurality of image layers. Each image layer includes at least one feature of a scene. An identification unit analyzes the plurality of image layers from the SVD unit to determine a shape or a location of the object from the scene.
Public/Granted literature
- US20150198703A1 POLARIZED MILLIMETER WAVE IMAGING SYSTEM AND METHOD Public/Granted day:2015-07-16
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