发明授权
- 专利标题: Self-capacitance detection using trans-conductance reference
- 专利标题(中): 使用反电导参考的自电容检测
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申请号: US13471094申请日: 2012-05-14
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公开(公告)号: US09306560B2公开(公告)日: 2016-04-05
- 发明人: Tajeshwar Singh
- 申请人: Tajeshwar Singh
- 申请人地址: US CA San Jose
- 专利权人: Atmel Corporation
- 当前专利权人: Atmel Corporation
- 当前专利权人地址: US CA San Jose
- 代理机构: Baker Botts L.L.P.
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; H03K17/955 ; G06F3/044
摘要:
In one embodiment, a method includes modifying a voltage at a capacitance of a touch sensor to a first voltage level. The method also includes modifying the voltage at the capacitance to a second voltage level, resulting in a first current. The method also includes modifying a voltage at an integration capacitor to a charging-voltage level based on the first current. The method also includes determining whether a touch input to the touch sensor has occurred based on the charging-voltage level.
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