Invention Grant
- Patent Title: Apparatus and method for detecting lesion
- Patent Title (中): 用于检测病变的装置和方法
-
Application No.: US14308469Application Date: 2014-06-18
-
Publication No.: US09305349B2Publication Date: 2016-04-05
- Inventor: Baek-Hwan Cho , Yeong-Kyeong Seong , Ye-Hoon Kim , Jung-Hoe Kim , Moon-Ho Park , Sin-Sang Yu
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2013-0075917 20130628
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
An apparatus and method for detecting a lesion, which enables to adaptively determine a parameter value of a lesion detection process using a feature value extracted from a received medical image and a parameter prediction model to improve accuracy in lesion detection and lesion diagnosis. The apparatus and the method include a model generator configured to generate a parameter prediction model based on pre-collected medical images, an extractor configured to extract a feature value from a received medical image, and a determiner configured to determine a parameter value of a lesion detection process using the extracted feature value and the parameter prediction model.
Public/Granted literature
- US20150003677A1 APPARATUS AND METHOD FOR DETECTING LESION Public/Granted day:2015-01-01
Information query