发明授权
- 专利标题: Capacitor and semiconductor device having oxide semiconductor
- 专利标题(中): 具有氧化物半导体的电容器和半导体器件
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申请号: US13336387申请日: 2011-12-23
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公开(公告)号: US09287294B2公开(公告)日: 2016-03-15
- 发明人: Shunpei Yamazaki
- 申请人: Shunpei Yamazaki
- 申请人地址: JP Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Kanagawa-ken
- 代理机构: Fish & Richardson P.C.
- 优先权: JP2010-293055 20101228
- 主分类号: H01L27/12
- IPC分类号: H01L27/12 ; C04B35/58 ; H01L29/786
摘要:
An object is to provide a novel semiconductor device which can store data even when power is not supplied in a data storing time and which does not have a limitation on the number of writing operations. The semiconductor device includes a transistor and a capacitor. The transistor includes a first oxide semiconductor layer, a source electrode and a drain electrode which are in contact with the first oxide semiconductor layer, a gate electrode overlapping with the first oxide semiconductor layer, and a gate insulating layer between the first oxide semiconductor layer and the gate electrode. The capacitor includes the source electrode or the drain electrode, a second oxide semiconductor layer in contact with the source electrode or the drain electrode, and a capacitor electrode in contact with the second oxide semiconductor layer.
公开/授权文献
- US20120161132A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF 公开/授权日:2012-06-28
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