发明授权
- 专利标题： Repair system for semiconductor apparatus and repair method using the same
- 专利标题（中）： 半导体装置修理系统及其修理方法
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申请号： US14607699申请日： 2015-01-28
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公开(公告)号： US09287010B1公开(公告)日： 2016-03-15
- 发明人: Jung Taek You , Byung Kuk Yoon
- 申请人： SK hynix Inc.
- 申请人地址： KR Gyeonggi-do
- 专利权人： SK Hynix Inc.
- 当前专利权人： SK Hynix Inc.
- 当前专利权人地址： KR Gyeonggi-do
- 代理机构： William Park & Associates Ltd.
- 优先权： KR10-2014-0153732 20141106
- 主分类号： G11C16/06
- IPC分类号： G11C16/06 ; G11C29/00 ; G11C29/04 ; G11C17/16
摘要：
A repair system for a semiconductor apparatus includes a tester configured to generate memory repair data including a die identification information and repair addresses, and a command to perform a repair process; and a semiconductor apparatus including a plurality of dies configured to receive the memory repair data, wherein one of the dies corresponding to the die identification information performs a repair operation according to the repair addresses and the command.
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