发明授权
US09246031B1 Supressing optical loss in nanostructured metals by increasing self-inductance and electron path length 有权
通过增加自感和电子路径长度来抑制纳米结构金属的光损耗

  • 专利标题: Supressing optical loss in nanostructured metals by increasing self-inductance and electron path length
  • 专利标题(中): 通过增加自感和电子路径长度来抑制纳米结构金属的光损耗
  • 申请号: US14471124
    申请日: 2014-08-28
  • 公开(公告)号: US09246031B1
    公开(公告)日: 2016-01-26
  • 发明人: Sang Eon HanSamuel Clark
  • 申请人: Sang Eon HanSamuel Clark
  • 申请人地址: US NM Albuquerque
  • 专利权人: STC.UNM
  • 当前专利权人: STC.UNM
  • 当前专利权人地址: US NM Albuquerque
  • 代理机构: Vogt IP
  • 代理商 Keith A. Vogt
  • 主分类号: H01L31/0224
  • IPC分类号: H01L31/0224 H01L31/0735 H01L31/073 H01L21/329
Supressing optical loss in nanostructured metals by increasing self-inductance and electron path length
摘要:
An optoelectronic device configured to operate at an electromagnetic radiation frequency having metal wire electrodes that are optically transparent as a result of the wires having an effective plasma frequency that is equal to or lower than the electromagnetic frequency at which the device operates. The effective plasma frequency of the wire is lowered by configuring the path of the wire between the terminal ends to be meandering, serpentine, U-shaped and in other non-linear configurations.
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