Invention Grant
- Patent Title: Integration of chips and silicon-based trench capacitors using low parasitic silicon-level connections
- Patent Title (中): 使用低寄生硅电平连接集成芯片和硅基沟槽电容器
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Application No.: US13725699Application Date: 2012-12-21
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Publication No.: US09236442B2Publication Date: 2016-01-12
- Inventor: Milind S. Bhagavat , Sampath Komarapalayam Velayudham Karikalan , Rezaur Rahman Khan
- Applicant: Broadcom Corporation
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agency: Fiala & Weaver P.L.L.C.
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L29/66 ; H01L27/08 ; H01L29/94 ; H01L21/48 ; H01L25/16 ; H01L21/768 ; H01L23/14 ; H01L23/498 ; H01L21/56 ; H01L23/00

Abstract:
Methods and apparatuses are described for integration of integrated circuit die and silicon-based trench capacitors using silicon-level connections to reduce connection lengths, parasitics and necessary capacitance magnitudes and volumes. A trench capacitor can be fabricated on silicon and mounted on or embedded in a chip or one or more sides of a through silicon interposer (TSI) for silicon-level connections to chip circuitry. Aspect ratio dependent, as opposed to trench diameter or trench depth dependent, trench capacitors formed by a dense array of high aspect ratio trenches with thin, high permittivity dielectric increase capacitance per unit area and volume, resulting in thin, high capacitance trench capacitors having thickness equal to or less than chip thickness.
Public/Granted literature
- US20140145300A1 INTEGRATION OF CHIPS AND SILICON-BASED TRENCH CAPACITORS USING LOW PARASITIC SILICON-LEVEL CONNECTIONS Public/Granted day:2014-05-29
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