Invention Grant
- Patent Title: Analysis device and analysis method
- Patent Title (中): 分析装置及分析方法
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Application No.: US14704460Application Date: 2015-05-05
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Publication No.: US09214324B2Publication Date: 2015-12-15
- Inventor: Hisashi Nagano , Yasutaka Iida , Hideo Kashima , Yuichiro Hashimoto , Masuyuki Sugiyama , Masakazu Sugaya , Yasunori Doi , Koichi Terada
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP2010-252663 20101111; JP2011-181058 20110823; JP2011-181090 20110823
- Main IPC: G01N1/22
- IPC: G01N1/22 ; H01J49/04

Abstract:
Provided is a technique of analyzing particles in real time while collecting and condensing the particles continuously. Gas and/or particles as a detection target substance that are attached to an authentication target 2 are removed by air flow from a blowing region 5. The removed sample is sucked and is condensed and sampled at a sampling region 10, and ions of the sample are generated at an ion source 21 and are then subjected to mass analysis at a mass analysis region 23. Determination of the obtained mass spectrum is made as to the presence or not of a mass spectrum derived from the detection target substance, and a monitor 27 displays a result thereof. Thereby, the detection target substance attached to the authentication target 2 can be detected continuously in real time, promptly and with a less error rate.
Public/Granted literature
- US20150235831A1 ANALYSIS DEVICE AND ANALYSIS METHOD Public/Granted day:2015-08-20
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