发明授权
US09124529B1 Methods and apparatus for assessing the quality of a data path including both layer-2 and layer-3 devices
有权
用于评估包括第2层和第3层设备的数据路径质量的方法和设备
- 专利标题： Methods and apparatus for assessing the quality of a data path including both layer-2 and layer-3 devices
- 专利标题（中）： 用于评估包括第2层和第3层设备的数据路径质量的方法和设备
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申请号： US13722064申请日： 2012-12-20
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公开(公告)号： US09124529B1公开(公告)日： 2015-09-01
- 发明人: Ankit Chadha
- 申请人： Juniper Networks, Inc.
- 申请人地址： US CA Sunnyvale
- 专利权人： Juniper Networks, Inc.
- 当前专利权人： Juniper Networks, Inc.
- 当前专利权人地址： US CA Sunnyvale
- 代理机构： Cooley LLP
- 主分类号： H04L12/26
- IPC分类号： H04L12/26 ; H04L12/28 ; H04L12/24 ; H04L12/751
摘要：
In some embodiments, an apparatus includes a layer-2 device operably coupled to a source device and a destination device and disposed within a data path (1) between the source device and the destination device, and (2) includes at least one layer-3 device. The layer-2 device receives a first test data unit from the source device, and defines a quality datum associated with processing the first test data unit. The layer-2 device defines a second test data unit based on the first test data unit that includes the quality datum associated with processing the first test data unit. The layer-2 device sends the second test data unit to the layer-3 device. The layer-3 device defines a quality datum associated with processing the second test data unit at the layer-3 device and defines a third test data unit based on the second test data unit.
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